Lastest Update: 4th Nov 2024 

Papers

• An Empirical Study on Automatically Detecting AI-Generated Source Code: How Far Are We?
  Hyunjae Suh, Mahan Tafreshipour, Jiawei Li, Adithya Bhattiprolu, Iftekhar Ahmed
  2025 IEEE/ACM 47th International Conference on Software Engineering (ICSE)

• Only diff is Not Enough: Generating Commit Messages Leveraging Reasoning and Action of Large Language Model
  Jiawei Li, David Farago, Christian Petrov, Iftekhar Ahmed
  The ACM International Conference on the Foundations of Software Engineering 2024 (FSE)
  ACM SIGSOFT Distinguished Paper Award
  

• A Deep Dive Into Large Language Model Code Generation Mistakes: What and Why?
  Qihong Chen, Jiawei Li, Jiecheng Deng, Jiachen Yu, Justin Tian Jin Chen, Iftekhar Ahmed
  arXiv preprint arXiv:2411.01414

• Commit Message Matters: Investigating Impact and Evolution of Commit Message Quality
  Jiawei Li, Iftekhar Ahmed
  2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE)

• Test Smell: A Parasitic Energy Consumer in Software Testing
  Md Rakib Hossain Misu, Jiawei Li, Adithya Bhattiprolu, Yang Liu, Eduardo Almeida, Iftekhar Ahmed
  arXiv preprint arXiv:2310.14548

• Does the Order of Fine-tuning Matter and Why?
  Qihong Chen, Jiawei Li (Equal Contribution), Hyunjae Suh, Lianghao Jiang, Zheng Zhou, Jingze Chen, Jiri Gesi, Iftekhar Ahmed
  arXiv preprint arXiv:2410.02915

• Automated Repair of Declarative Software Specifications in the Era of Large Language Models
  Md Rashedul Hasan, Jiawei Li, Iftekhar Ahmed, Hamid Bagheri
  arXiv preprint arXiv:2310.12425

• Code Smells in Machine Learning Systems
  Jiri Gesi, Siqi Liu, Jiawei Li, Iftekhar Ahmed, Nachiappan Nagappan, David Lo, Eduardo Santana de Almeida, Pavneet Singh Kochhar, Lingfeng Bao
  arXiv preprint arXiv:2203.00803

• PyNose: A Test Smell Detector For Python
  Tongjie Wang, Yaroslav Golubev, Oleg Smirnov, Jiawei Li, Timofey Bryksin, Iftekhar Ahmed
  2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE)

• An Empirical Examination of the Impact of Bias on Just‐in‐time Defect Prediction
  Jiri Gesi, Jiawei Li, Iftekhar Ahmed
  Proceedings of the 15th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)

• Changes from the trenches: Should we automate them?
  Yaroslav Golubev, Jiawei Li, Viacheslav Bushev, Timofey Bryksin, Iftekhar Ahmed
  arXiv preprint arXiv:2105.10157